| Name | Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard |
|---|---|
| Description | Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard |
| Comments | Approved 2017 |
| Validity From | 2017-01-01 |
| Validity To | 2099-12-31 |
| Reference | LS 431-2017/IEC 62880-1:2017 |
| Measure Type | National Standard |
| Agency | Ministry of Science and Technology |
| Legal Document | - Standards Law No. 13/NA |
| UN Code | ZZZ |
Commodity/s
| # | HS Code | Description |
|---|
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